演講公告
新聞標題： ( 2012-09-25 )
演講主題：Multi-group Testing
主講人：陳宏賓 博士(中央研究院 數學研究所)
演講日期：2012年10月2日(星期二) 下午2:00 –3:00
演講地點：(光復校區) 科學一館223室
茶會時間：當天下午1:30 (科學一館205室)
摘要內容：
A frequently used tool to identify an unknown set of defective (positive) elements out of a large collection of elements by group tests is called Group Testing. In the classic group testing, a ``group'' test can be any ``subset'' of the given collection and its outcome is binary: YES or NO.The former indicates that there is a positive element in this test and the latter implies no positive elements.
In this talk, I will introduce a novel but natural generalization of Group Testing, called Multi-group Testing. Namely, a test can be applied to any ``multi-subset'' of the given set, where ``multi'' means a single element is allowed to be taken more than one copies in a same test. In this case, the outcome is also relaxed to under arithmetic operations. This relaxation has an advantage of being sensitive to the differences among the elements to be tested.
The mathematical model is then described as follows. Let $x$ be an unknown vector in $\real^n$. A measurement (test) can be applied to any vector $y$ in $\real^n$ with a corresponding outcome, inner product $<y,x>$. The goal is to identify the unknown vector $x$ through measurements efficiently. In this talk, I will focus on 1-stage strategies for this problem.
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