Colloquium / Seminars

• Topic：Introduction of semiconductor memory and its reliability issues

• Speaker：Prof. Riichiro Shirota
  　　　　(College of Semiconductor Research, National Tsing Hua University)

• Date time：May 20, 2025 14:00 - 15:00

• Venue：SA213

• Abstract：
  

  Abstract：
  1. Operation method of MOSFET and memory devices
  2. Recent development of 3-Dimensional devices (Flash memory & DRAM)
  3. Reliability issues of Flash memory
  (limitation of number of rewrite cycles and the difficulty to analyze)
  4. Short review of my reliability studies

• Download：Talk_20250520.pdf

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